Zief, Morris.

Contamination control in trace element analysis / Morris Zief, James W. Mitchell. - New York : Wiley, c1976 - xiv, 262 p. : ill. ; 24 cm. - Chemical analysis v. 47 .

"A Wiley-Interscience publication."

Includes bibliographical references and index.

0471611697


Trace elements--Analysis.
Contamination (Technology).

545 / ZIE