Accuracy in trace analysis : sampling, sample handling, analysis : proceedings of the 7th Materials Research Symposium held at the National Bureau of Standards, Gaithersburg, Md., October 7-11, 1974 / Philip D. LaFleur, editor - Washington, D.C. : U.S. Dept. of Commerce, National Bureau of Standards : for sale by the Supt. of Docs., U.S. Govt. Print. Off., 1976 - 2v. : ill. ; 29 cm. - NBS special publication 422, v.1-2 .

Includes bibliographical references

Trace analysis--Congresses.
Trace elements--Analysis.
Chemistry, Analytic--Congresses.
Trace elements--Congresses.

543 / MAT Ref.