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Handbook of surface and interface analysis [electronic resource] :methods for problem-solving / edited by John C. Riviaere, Sverre Myhra.

Contributor(s): Riviaere, J. C | Myhra, S. (Sverre), 1943-.
Material type: materialTypeLabelComputer filePublisher: Boca Raton : CRC Press, c2009Edition: 2nd ed.Description: xx, 651 p., [8] p. of plates : ill. (some col.).ISBN: 9781420007800 (e-book : PDF); 0849375584; 9780849375583.Call number: 620.44 H236 Subject(s): Surfaces (Physics) -- Analysis | Interfaces (Physical sciences) -- Analysis | Surface chemistry | Surfaces (Technology) -- AnalysisGenre/Form: Electronic books.Online resources: Distributed by publisher. Purchase or institutional license may be required for access.
Contents:
ch. 1. Introduction / John C. Riviaere -- ch. 2. Problem solving : strategy, tactics, and resources / Sverre Myhra and John C. Riviaere -- ch. 3. Photoelectron spectroscopy (XPS and UPS), Auger electron spectroscopy (AES), and ion scattering spectroscopy (ISS) / Vaneica Y. Young and Gar B. Hoflund -- ch. 4. Ion beam techniques : time-of-flight secondary ion mass spectrometry (ToF-SIMS) / Birgit Hagenhoff, Reinhard Kerstign, and Derk Rading -- ch. 5. Surface and interface analysis by scanning probe microscopy / Sverre Myhra -- ch. 6. Transmission electron microscopy : instrumentation, imaging modes, and analytical attachments / John M. Titchmarsh -- ch. 7. Synchrotron-based techniques / Andrea R. Gerson, David J. Cookson, and Kevin C. Prince-- ch. 8. Quantification of surface and near-surface composition by AES and XPS / Sven Tougaard --
ch. 9. Structural and analytical methods for surfaces and interfaces : transmission electron microscopy / John M. Titchmarsh -- ch. 10. In-depth analysis/profiling / Francois Reniers and Craig R. Tewell -- ch. 11. Characterization of nanostructured materials / Matthias Werner, Alison Crossley, and Colin Johnston -- ch. 12. Problem-solving methods in tribology with surface-specific techniques / Christophe Donnet and Jean-Michel Martin -- ch. 13. Problem-solving methods in metallurgy with surface analysis / R.K. Wild -- ch. 14. Composites / Peter M.A. Sherwood -- ch. 15. Minerals, ceramics, and glasses / Roger St. C. Smart -- ch. 16. Catalyst characterization / Wolfgang E.S. Unger and Thomas Gross -- ch. 17. Surface analysis of biomaterials / Marek Jasieniak ... [et al.] -- ch. 18. Adhesion science and technology / John F. Watts -- ch. 19. Electron spectroscopy in corrosion science / James E. Castle.
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English ebook

Includes bibliographical references and index.

ch. 1. Introduction / John C. Riviaere -- ch. 2. Problem solving : strategy, tactics, and resources / Sverre Myhra and John C. Riviaere -- ch. 3. Photoelectron spectroscopy (XPS and UPS), Auger electron spectroscopy (AES), and ion scattering spectroscopy (ISS) / Vaneica Y. Young and Gar B. Hoflund -- ch. 4. Ion beam techniques : time-of-flight secondary ion mass spectrometry (ToF-SIMS) / Birgit Hagenhoff, Reinhard Kerstign, and Derk Rading -- ch. 5. Surface and interface analysis by scanning probe microscopy / Sverre Myhra -- ch. 6. Transmission electron microscopy : instrumentation, imaging modes, and analytical attachments / John M. Titchmarsh -- ch. 7. Synchrotron-based techniques / Andrea R. Gerson, David J. Cookson, and Kevin C. Prince-- ch. 8. Quantification of surface and near-surface composition by AES and XPS / Sven Tougaard --

ch. 9. Structural and analytical methods for surfaces and interfaces : transmission electron microscopy / John M. Titchmarsh -- ch. 10. In-depth analysis/profiling / Francois Reniers and Craig R. Tewell -- ch. 11. Characterization of nanostructured materials / Matthias Werner, Alison Crossley, and Colin Johnston -- ch. 12. Problem-solving methods in tribology with surface-specific techniques / Christophe Donnet and Jean-Michel Martin -- ch. 13. Problem-solving methods in metallurgy with surface analysis / R.K. Wild -- ch. 14. Composites / Peter M.A. Sherwood -- ch. 15. Minerals, ceramics, and glasses / Roger St. C. Smart -- ch. 16. Catalyst characterization / Wolfgang E.S. Unger and Thomas Gross -- ch. 17. Surface analysis of biomaterials / Marek Jasieniak ... [et al.] -- ch. 18. Adhesion science and technology / John F. Watts -- ch. 19. Electron spectroscopy in corrosion science / James E. Castle.

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