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Accuracy in trace analysis : sampling, sample handling, analysis : proceedings of the 7th Materials Research Symposium held at the National Bureau of Standards, Gaithersburg, Md., October 7-11, 1974 / Philip D. LaFleur, editor

By: (7th : Materials Research Symposium (7th : 1974 : Gaithersburg, Md).
Contributor(s): LaFleur, Philip D.
Material type: materialTypeLabelBookSeries: NBS special publication 422, v.1-2. Publisher: Washington, D.C. : U.S. Dept. of Commerce, National Bureau of Standards : for sale by the Supt. of Docs., U.S. Govt. Print. Off., 1976Description: 2v. : ill. ; 29 cm.Call number: 543 MAT Ref. Subject(s): Trace analysis -- Congresses | Trace elements -- Analysis | Chemistry, Analytic -- Congresses | Trace elements -- Congresses | Sampling | Congresses -- AnalysisOnline resources: Click here to access online
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